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Interactions of MeV ions with matter permit microanalysis and imaging of sample constituents using excited X-rays
(PIXE - Proton Induced X-ray Emission), gamma-rays from nuclear reactions
(PIGE - Proton Induced Gamma-ray Emission), outgoing nuclear reaction particles
(NRA - Nuclear Reaction Analysis), elastically scattered ions
(BS - Backscattering), (ERDA - Elastic Recoil Detection Analysis),
or visible and infrared emissions from the sample
(IL - Ionoluminescence). The ion beam can also be channelled down crystal axes and planes. Many of these techniques can be combined with channelling to study the lattice location of species (CCM - Channelling Contrast Microscopy). MeV protons are very penetrating while producing very little sample damage. These qualities permit the in situ, non-destructive analysis and imaging of buried structures such as solid and fluid inclusions in minerals.
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For further information contact: Dr.
Chris Ryan via email: (Chris.Ryan@csiro.au)
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